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Approved Method: Optical and Electrical Measurement of Ultraviolet LEDs

Optical and Electrical Measurement of Ultraviolet LEDs

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ANSI/IES LM-92-22
Document Type: Lighting Measurement and Testing (LM)

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SKU: ANSI/IES LM-92-22 Category: Tag:

Product Description

Approved American National StandardThis new Lighting Measurement (LM) standard, developed by subject matter experts from IES and the International Ultraviolet Association (IUVA), provides guidance for the measurement of UV-emitting LEDs, normally available in the form of an LED package, array, or module. Due to the optical characteristics of UV LEDs and their dependence on junction temperature, the only way to obtain reproducible results universally for all types of UV LEDs is by setting them to a specified junction temperature. The test method described in this document sets the UV LED under test to a pre-determined junction temperature for measurement under a continuous-pulse mode of operation. Such a method can establish equivalence of results between the pulse-mode operation (normally performed by UV LED manufacturers) and the DC-mode operation of products in actual-use conditions. This LM describes uniform methods for operation of UV LEDs and test methods for optical and electrical measurements of UV LED output, and provides the grounds for specification of UV LEDs at high-temperature conditions.

Page count: 23 pages
Publisher: Illuminating Engineering Society (2022)
SKU: ANSI/IES LM-92-22
ISBN-13: 978-0-87995-419-2

Chapters:

  • 1.0 Introduction and Scope
    2.0 Normative References
    3.0 Definitions
    4.0 Physical and Environmental Test Conditions
    5.0 Electrical Test Equipment
    6.0 Optical Measurement and Equipment
    7.0 Test Preparation
    8.0 Measurement Methods
    9.0 Measurement Uncertainty
    10.0 Test Report

 
Citation Format:
Illuminating Engineering Society. ANSI/IES LM-92-22, Approved Method: Optical and Electrical Measurement of Ultraviolet LEDs. New York: IES; 2022.

CONTENTS

  • 1.0 Introduction and Scope
  • 1.1 Introduction
  • 1.2 Scope
  • 2.0 Normative References
  • 2.1 ANSI/IES LM-58-20
  • 2.2 ANSI/IES LM-75-19
  • 2.3 ANSI/IES LM-78-20
  • 2.4 ANSI/IES LS-1-21
  • 3.0 Definitions
  • 3.1 data acquisition (DAQ)
  • 3.2 device under test (DUT)
  • 3.3 digital multimeter (DMM)
  • 3.4 junction temperature (TJ)
  • 3.5 out-of-band light
  • 3.6 pulse period jitter
  • 3.7 pulse width error
  • 3.8 pulse width jitter
  • 3.9 pulsed current source (PCS)
  • 3.10 settling time
  • 3.11 source measure unit (SMU)
  • 3.12 temperature-controlled mount (TCM)
  • 3.13 UV LED
  • 4.0 Physical and Environmental Test Conditions
  • 4.1 Thermal Conditions
    4.1.1 Junction Temperature, TJ
    4.1.2 Temperature Control of the DUT
    4.1.3 Ambient Temperature (TA)
  • 4.2 Airflow
  • 4.3 Thermal Conditions for Mounting DUTs
  • 4.4 Vibration
  • 4.5 Humidity
  • 5.0 Electrical Test Equipment
  • 5.1 Pulsed Current Source (PCS) or Source Measure Unit (SMU)
  • 5.2 Pulse Amplitude Measuring Device
  • 5.3 Current Shunt or Current Probe
  • 5.4 DMM with Multi-slope Integrator or High-Speed DAQ
  • 5.5 Oscilloscope or SMU Display
  • 5.6 Temperature-Controlled Mount
  • 6.0 Optical Measurement and Equipment
  • 6.1 Integrating Sphere
    6.1.1 Detector
    6.1.2 Radiometer
    6.1.3 Spectroradiometer
    6.1.4 Auxiliary Source
    6.1.5 Fluorescence and Phosphorescence
    6.1.6 Stray Light
  • 6.2 Goniometer
    6.2.1 Detector
    6.2.2 Radiometer
    6.2.3 Spectroradiometer
    6.2.4 Stray Light
    6.2.5 Angular Resolution and Sampling
    6.2.6 Angular Range
    6.2.7 Goniometer Alignment
  • 7.0 Test Preparation
  • 7.1 DUT Identification
  • 7.2 DUT Handling
  • 7.3 Seasoning
  • 7.4 Temperature Stabilization
  • 7.5 Operating Position and Orientation
  • 8.0 Measurement Methods
  • 8.1 Continuous Pulse Measurement Technique – Foundation for the Differential Methods
    8.1.1 Overview
    8.1.2 Notes on Instrumentation
  • 8.2 Differential Continuous Pulse Method
  • 8.3 Mean Differential Continuous Pulse (M-DCP) Method
  • 8.4 DC Method
  • 8.5 Continuous Pulse Time Resolved (CPT) Method
  • 9.0 Measurement Uncertainty
  • 10.0 Test Report
  • Annex A – Determination of Temperature Stability
  • Annex B – Determination of Transient Voltage Effect
  • Informative References