LM-85-23 Cover | Approved Method: Optical and Electrical Measurements of Led Sources | An American National Standard

Approved Method: Optical and Electrical Measurements of LED Sources

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ANSI/IES LM-85-23
Document Type: Lighting Measurement and Testing (LM)

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SKU: ANSI/IES LM-85-23 Category: Tag:

Product Description

Approved American National StandardLearn about the measurement of light emitting diode (LED) sources such as LED packages and LED arrays, our different measurement methods—single pulse, flash pulse, continuous pulse, and DC—which are described in this document.

Page count: 46 pages
Publisher: Illuminating Engineering Society (2023)
SKU: ANSI/IES LM-85-23
ISBN-13: 978-0-87995-468-0
Collection: Lighting Measurement & Testing
Previous edition: ANSI/IES LM-85-20

Chapters:

  • 1.0 Introduction and Scope
    2.0 Normative References
    3.0 Definitions
  • 4.0 Physical and Environmental Conditions
  • 5.0 Electrical Measurement Instrumentation
  • 6.0 Optical Measurement Instruments and Optical Measurements
  • 7.0 Preparation for Measurements
  • 8.0 Measurement Methods and Procedures
  • 9.0 Measurement Uncertainty
  • 10.0 Test Report

Citation Format:
Illuminating Engineering Society. ANSI/IES LM-85-23, Approved Method: Optical and Electrical Measurements of LED Sources. New York: IES; 2023.

CONTENTS

  • 1.0 Introduction and Scope
  • 1.1 Introduction
  • 1.2 Scope
  • 2.0 Normative References
  • 2.1 ANSI/IES LS-1-22
  • 2.2 ANSI/IES LS-58-20
  • 2.3 ANSI/IES LS-75-19
  • 2.4 ANSI/IES LS-78-20
  • 2.5 ISO/IEC GUIDE 98-3:2008
  • 2.6 JCGM 104:2009
  • 3.0 Defintions
  • 3.1 Device under test (DUT)
  • 3.2 junction temperature (TJ)
  • 3.3 LED source
  • 3.4 remote-phosphor LED or remote-phosphor laser diode source
  • 3.5 settling time
  • 3.6 temperature coefficient of forward voltage, SVF
  • 3.7 temperature-controlled mount (TCM)
  • 3.8 Uncertainty
  • 4.0 Physical and Environmental Conditions
  • 4.1 Ambient Temperature, TA
  • 4.2 Humidity
  • 4.3 Airflow
  • 4.4 Vibration
  • 5.0 Electrical Measurement Instrumentation
  • 5.1 Instrument Types
  • 5.1.1 PCS
  • 5.1.2 P-SMU
  • 5.1.3 DAQ
  • 5.1.4 Current Shunt or Current Probe
  • 5.1.5 DMM
  • 5.1.6 Oscilloscope
  • 5.1.7 TCM
  • 5.2 Instrument Uncertainty
  • 6.0 Optical Measurement Instruments and Optical Measurements
  • 6.1 Optical Measurement Instruments
  • 6.1.1 Sphere-Spectroradiometers
  • 6.1.2 Sphere-Photometers
  • 6.1.3 Goniophotometers
  • 6.1.4 Goniospectroradiometers
  • 6.2 Optical Measurements
  • 6.2.1 Total Flux
  • 6.2.2 Intensity Distribution
  • 6.2.3 Color Quantities
  • 6.2.4 Spectral Characteristics
  • 6.3 Fluorescence Error
  • 7.0 Preparation for Measurements
  • 7.1 Seasoning
  • 7.2 Operating Orientation
  • 7.3 Thermal Conditions
  • 7.3.1 Junction Temperature, TJ
  • 7.3.2 Temperature Control of the DUT
  • 7.3.3 Ambient Temperature, TA
  • 8.0 Measurement Methods and Procedures
  • 8.1 The SP Methods
  • 8.1.1 SP-1 Method
  • 8.1.2 SP-2 Method
  • 8.1.3 SP-3 Method
  • 8.2 Flash Pulse (FP) Method
  • 8.2.1 D-FP Method
  • 8.2.2 P-FP Method
  • 8.3 Continuous-Pulse (CP) Methods
  • 8.3.1 Differential Continuous Pulse (DCP) Method
  • 8.3.2 Mean Differential Continuous Pulse (M-DCP) Method
  • 8.4 DC Method
  • 8.4.1 General
  • 8.4.2 Ambient Temperature
  • 8.4.3 Measurement Procedure
  • 9.0 Measurement Uncertainty
  • 10.0 Test Report
  • Annex A – Determination of Temperature Stability
  • Annex B – Determination of Transient Voltage Anomaly Effect
  • Annex C – Assessing TJ Rise in Continuous-Pulse Mode Using Transient Thermal Resistance
  • Annex D – Assessing TJ Rise During Pulsed Operation Using a DUT Temperature Sensitive Parameter
  • Informative References